|
|
|
|
LEADER |
00000nam a22000005i 4500 |
001 |
978-3-662-44482-5 |
003 |
DE-He213 |
005 |
20220119132654.0 |
007 |
cr nn 008mamaa |
008 |
140915s2015 gw | s |||| 0|eng d |
020 |
|
|
|a 9783662444825
|9 978-3-662-44482-5
|
024 |
7 |
|
|a 10.1007/978-3-662-44482-5
|2 doi
|
050 |
|
4 |
|a TK7867-7867.5
|
072 |
|
7 |
|a TJFC
|2 bicssc
|
072 |
|
7 |
|a TEC008010
|2 bisacsh
|
072 |
|
7 |
|a TJFC
|2 thema
|
082 |
0 |
4 |
|a 621.3815
|2 23
|
100 |
1 |
|
|a Goll, Bernhard.
|e author.
|4 aut
|4 http://id.loc.gov/vocabulary/relators/aut
|
245 |
1 |
0 |
|a Comparators in Nanometer CMOS Technology
|h [electronic resource] /
|c by Bernhard Goll, Horst Zimmermann.
|
250 |
|
|
|a 1st ed. 2015.
|
264 |
|
1 |
|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2015.
|
300 |
|
|
|a XIV, 250 p. 217 illus., 37 illus. in color.
|b online resource.
|
336 |
|
|
|a text
|b txt
|2 rdacontent
|
337 |
|
|
|a computer
|b c
|2 rdamedia
|
338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
347 |
|
|
|a text file
|b PDF
|2 rda
|
490 |
1 |
|
|a Springer Series in Advanced Microelectronics,
|x 2197-6643 ;
|v 50
|
505 |
0 |
|
|a Fundamentals of clocked, regenerative comparators -- State-of-the-art nanometer CMOS -- Measurement circuits and setup -- Comparators in 120 nm CMOS -- Comparators in 65 nm CMOS -- Conclusions and comparison.
|
520 |
|
|
|a This book covers the complete spectrum of the fundamentals of clocked, regenerative comparators, their state-of-the-art, advanced CMOS technologies, innovative comparators inclusive circuit aspects, their characterization and properties. Starting from the basics of comparators and the transistor characteristics in nanometer CMOS, seven high-performance comparators developed by the authors in 120nm and 65nm CMOS are described extensively. Methods and measurement circuits for the characterization of advanced comparators are introduced. A synthesis of the largely differing aspects of demands on modern comparators and the properties of devices being available in nanometer CMOS, which are posed by the so-called nanometer hell of physics, is accomplished. The book summarizes the state of the art in integrated comparators. Advanced measurement circuits for characterization will be introduced as well as the method of characterization by bit-error analysis usually being used for characterization of optical receivers. The book is compact, and the graphical quality of the illustrations is outstanding. This book is written for engineers and researchers in industry as well as scientists and Ph.D students at universities. It is also recommendable to graduate students specializing on nanoelectronics and microelectronics or circuit design.
|
650 |
|
0 |
|a Electronic circuits.
|
650 |
|
0 |
|a Nuclear physics.
|
650 |
|
0 |
|a Microtechnology.
|
650 |
|
0 |
|a Microelectromechanical systems.
|
650 |
|
0 |
|a Electronics.
|
650 |
|
0 |
|a Materials-Analysis.
|
650 |
1 |
4 |
|a Electronic Circuits and Systems.
|
650 |
2 |
4 |
|a Nuclear Physics.
|
650 |
2 |
4 |
|a Microsystems and MEMS.
|
650 |
2 |
4 |
|a Electronics and Microelectronics, Instrumentation.
|
650 |
2 |
4 |
|a Characterization and Analytical Technique.
|
700 |
1 |
|
|a Zimmermann, Horst.
|e author.
|4 aut
|4 http://id.loc.gov/vocabulary/relators/aut
|
710 |
2 |
|
|a SpringerLink (Online service)
|
773 |
0 |
|
|t Springer Nature eBook
|
776 |
0 |
8 |
|i Printed edition:
|z 9783662444832
|
776 |
0 |
8 |
|i Printed edition:
|z 9783662444818
|
776 |
0 |
8 |
|i Printed edition:
|z 9783662520239
|
830 |
|
0 |
|a Springer Series in Advanced Microelectronics,
|x 2197-6643 ;
|v 50
|
856 |
4 |
0 |
|u https://doi.uam.elogim.com/10.1007/978-3-662-44482-5
|z Texto Completo
|
912 |
|
|
|a ZDB-2-ENG
|
912 |
|
|
|a ZDB-2-SXE
|
950 |
|
|
|a Engineering (SpringerNature-11647)
|
950 |
|
|
|a Engineering (R0) (SpringerNature-43712)
|