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Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits

Resistance and capacitance (RC) extraction is an essential step in modeling the interconnection wires and substrate coupling effect in nanometer-technology integrated circuits (IC). The field-solver techniques for RC extraction guarantee the accuracy of modeling, and are becoming increasingly import...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Yu, Wenjian (Autor), Wang, Xiren (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014.
Edición:1st ed. 2014.
Temas:
Acceso en línea:Texto Completo

MARC

LEADER 00000nam a22000005i 4500
001 978-3-642-54298-5
003 DE-He213
005 20220119203348.0
007 cr nn 008mamaa
008 140421s2014 gw | s |||| 0|eng d
020 |a 9783642542985  |9 978-3-642-54298-5 
024 7 |a 10.1007/978-3-642-54298-5  |2 doi 
050 4 |a TK7867-7867.5 
072 7 |a TJFC  |2 bicssc 
072 7 |a TEC008010  |2 bisacsh 
072 7 |a TJFC  |2 thema 
082 0 4 |a 621.3815  |2 23 
100 1 |a Yu, Wenjian.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
245 1 0 |a Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits  |h [electronic resource] /  |c by Wenjian Yu, Xiren Wang. 
250 |a 1st ed. 2014. 
264 1 |a Berlin, Heidelberg :  |b Springer Berlin Heidelberg :  |b Imprint: Springer,  |c 2014. 
300 |a XV, 246 p. 104 illus.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
505 0 |a Introduction -- Basic Field-Solver Techniques for RC Extraction -- Fast Boundary Element Methods for Capacitance Extraction (I) -- Fast Boundary Element Methods for Capacitance Extraction (II) -- Resistance Extraction of Complex 3-D Interconnects -- Substrate Resistance Extraction with Boundary Element Method -- Extracting Frequency-Dependent Substrate Parasitics -- Process Variation Aware Capacitance Extraction -- Statistical Capacitance Extraction Based on Continuous-Surface Geometric Model -- Fast Floating Random Walk Method for Capacitance Extraction -- FRW Based Solver for Chip-Scale Large Structures. 
520 |a Resistance and capacitance (RC) extraction is an essential step in modeling the interconnection wires and substrate coupling effect in nanometer-technology integrated circuits (IC). The field-solver techniques for RC extraction guarantee the accuracy of modeling, and are becoming increasingly important in meeting the demand for accurate modeling and simulation of VLSI designs. Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits presents a systematic introduction to, and treatment of, the key field-solver methods for RC extraction of VLSI interconnects and substrate coupling in mixed-signal ICs. Various field-solver techniques are explained in detail, with real-world examples to illustrate the advantages and disadvantages of each algorithm. This book will benefit graduate students and researchers in the field of electrical and computer engineering, as well as engineers working in the IC design and design automation industries. Dr. Wenjian Yu is an Associate Professor at the Department of Computer Science and Technology at Tsinghua University in China; Dr. Xiren Wang is a R&D Engineer at Cadence Design Systems in the USA. 
650 0 |a Electronic circuits. 
650 0 |a Computer-aided engineering. 
650 0 |a Mathematics-Data processing. 
650 0 |a Numerical analysis. 
650 0 |a Computer simulation. 
650 1 4 |a Electronic Circuits and Systems. 
650 2 4 |a Computer-Aided Engineering (CAD, CAE) and Design. 
650 2 4 |a Computational Science and Engineering. 
650 2 4 |a Numerical Analysis. 
650 2 4 |a Computer Modelling. 
700 1 |a Wang, Xiren.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer Nature eBook 
776 0 8 |i Printed edition:  |z 9783642542992 
776 0 8 |i Printed edition:  |z 9783642542978 
776 0 8 |i Printed edition:  |z 9783662510223 
856 4 0 |u https://doi.uam.elogim.com/10.1007/978-3-642-54298-5  |z Texto Completo 
912 |a ZDB-2-ENG 
912 |a ZDB-2-SXE 
950 |a Engineering (SpringerNature-11647) 
950 |a Engineering (R0) (SpringerNature-43712)