In-situ Materials Characterization Across Spatial and Temporal Scales /

The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, elect...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Ziegler, Alexander (Editor ), Graafsma, Heinz (Editor ), Zhang, Xiao Feng (Editor ), Frenken, Joost W.M (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014.
Edición:1st ed. 2014.
Colección:Springer Series in Materials Science, 193
Temas:
Nanoscience.
Materials-Analysis.
Spectrum analysis.
Surfaces (Technology).
Thin films.
Nanotechnology.
Building materials.
Nanophysics.
Characterization and Analytical Technique.
Spectroscopy.
Surfaces, Interfaces and Thin Film.
Structural Materials.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Scanning Probe Microscopy on 'Live' Catalysts
  • In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources
  • Advanced in situ transmission electron microscopy
  • Ultra-fast TEM and Electron Diffraction
  • In-Situ Materials Characterization with FIB/SEM
  • In-situ X-ray photoelectron spectroscopy
  • "Real-time" probing of photo-induced molecular processes in liquids by ultrafast  X-ray absorption spectroscopy
  • Time-Resolved Neutron Scattering
  • Novel Detectors for Ultra-fast XRD, TEM and ED Characterization.

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