Cargando…
In-situ Materials Characterization Across Spatial and Temporal Scales /
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, elect...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor Corporativo: | |
| Otros Autores: | , , , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2014.
|
| Edición: | 1st ed. 2014. |
| Colección: | Springer Series in Materials Science,
193 |
| Temas: | |
| Acceso en línea: | Texto Completo |
MARC
| LEADER | 00000nam a22000005i 4500 | ||
|---|---|---|---|
| 001 | 978-3-642-45152-2 | ||
| 003 | DE-He213 | ||
| 005 | 20220119222250.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 140401s2014 gw | s |||| 0|eng d | ||
| 020 | |a 9783642451522 |9 978-3-642-45152-2 | ||
| 024 | 7 | |a 10.1007/978-3-642-45152-2 |2 doi | |
| 050 | 4 | |a QC176.8.N35 | |
| 072 | 7 | |a PHFC |2 bicssc | |
| 072 | 7 | |a SCI050000 |2 bisacsh | |
| 072 | 7 | |a PHFC |2 thema | |
| 072 | 7 | |a PDT |2 thema | |
| 082 | 0 | 4 | |a 530.41 |2 23 |
| 082 | 0 | 4 | |a 620.115 |2 23 |
| 245 | 1 | 0 | |a In-situ Materials Characterization |h [electronic resource] : |b Across Spatial and Temporal Scales / |c edited by Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken. |
| 250 | |a 1st ed. 2014. | ||
| 264 | 1 | |a Berlin, Heidelberg : |b Springer Berlin Heidelberg : |b Imprint: Springer, |c 2014. | |
| 300 | |a XI, 256 p. 124 illus., 78 illus. in color. |b online resource. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 347 | |a text file |b PDF |2 rda | ||
| 490 | 1 | |a Springer Series in Materials Science, |x 2196-2812 ; |v 193 | |
| 505 | 0 | |a Scanning Probe Microscopy on 'Live' Catalysts -- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources -- Advanced in situ transmission electron microscopy -- Ultra-fast TEM and Electron Diffraction -- In-Situ Materials Characterization with FIB/SEM -- In-situ X-ray photoelectron spectroscopy -- "Real-time" probing of photo-induced molecular processes in liquids by ultrafast X-ray absorption spectroscopy -- Time-Resolved Neutron Scattering -- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization. | |
| 520 | |a The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical, and x-ray microscopies (e.g., scanning, transmission, and low-energy electron microscopy, and scanning probe microscopy), or in the scattering realm with x-ray, neutron and electron diffraction. | ||
| 650 | 0 | |a Nanoscience. | |
| 650 | 0 | |a Materials-Analysis. | |
| 650 | 0 | |a Spectrum analysis. | |
| 650 | 0 | |a Surfaces (Technology). | |
| 650 | 0 | |a Thin films. | |
| 650 | 0 | |a Nanotechnology. | |
| 650 | 0 | |a Building materials. | |
| 650 | 1 | 4 | |a Nanophysics. |
| 650 | 2 | 4 | |a Characterization and Analytical Technique. |
| 650 | 2 | 4 | |a Spectroscopy. |
| 650 | 2 | 4 | |a Surfaces, Interfaces and Thin Film. |
| 650 | 2 | 4 | |a Nanotechnology. |
| 650 | 2 | 4 | |a Structural Materials. |
| 700 | 1 | |a Ziegler, Alexander. |e editor. |4 edt |4 http://id.loc.gov/vocabulary/relators/edt | |
| 700 | 1 | |a Graafsma, Heinz. |e editor. |4 edt |4 http://id.loc.gov/vocabulary/relators/edt | |
| 700 | 1 | |a Zhang, Xiao Feng. |e editor. |4 edt |4 http://id.loc.gov/vocabulary/relators/edt | |
| 700 | 1 | |a Frenken, Joost W.M. |e editor. |4 edt |4 http://id.loc.gov/vocabulary/relators/edt | |
| 710 | 2 | |a SpringerLink (Online service) | |
| 773 | 0 | |t Springer Nature eBook | |
| 776 | 0 | 8 | |i Printed edition: |z 9783642451539 |
| 776 | 0 | 8 | |i Printed edition: |z 9783642451515 |
| 776 | 0 | 8 | |i Printed edition: |z 9783662519769 |
| 830 | 0 | |a Springer Series in Materials Science, |x 2196-2812 ; |v 193 | |
| 856 | 4 | 0 | |u https://doi.uam.elogim.com/10.1007/978-3-642-45152-2 |z Texto Completo |
| 912 | |a ZDB-2-PHA | ||
| 912 | |a ZDB-2-SXP | ||
| 950 | |a Physics and Astronomy (SpringerNature-11651) | ||
| 950 | |a Physics and Astronomy (R0) (SpringerNature-43715) | ||