Theoretical Concepts of X-Ray Nanoscale Analysis Theory and Applications /

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in d...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Benediktovich, Andrei (Autor), Feranchuk, Ilya (Autor), Ulyanenkov, Alexander (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014.
Edición:1st ed. 2014.
Colección:Springer Series in Materials Science, 183
Temas:
Measurement.
Measuring instruments.
Materials-Analysis.
Mathematical physics.
Physics.
Spectrum analysis.
Measurement Science and Instrumentation.
Characterization and Analytical Technique.
Theoretical, Mathematical and Computational Physics.
Applied and Technical Physics.
Spectroscopy.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Basic principles of the interaction between X-rays and matter
  • X-ray reflectivity
  • High-resolution X-ray diffraction
  • Grazing-incidence small-angle X-ray scattering
  • Theory of X-ray scattering from imperfect crystals
  • X-ray diffraction for evaluation of residual stresses in polycrystals
  • Methods of mathematical and physical optimization of X-ray data analysis.

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