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Photomodulated Optical Reflectance A Fundamental Study Aimed at Non-Destructive Carrier Profiling in Silicon /
One of the critical issues in semiconductor technology is the precise electrical characterization of ultra-shallow junctions. Among the plethora of measurement techniques, the optical reflectance approach developed in this work is the sole concept that does not require physical contact, making it su...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2012.
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| Edición: | 1st ed. 2012. |
| Colección: | Springer Theses, Recognizing Outstanding Ph.D. Research,
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| Temas: | |
| Acceso en línea: | Texto Completo |
MARC
| LEADER | 00000nam a22000005i 4500 | ||
|---|---|---|---|
| 001 | 978-3-642-30108-7 | ||
| 003 | DE-He213 | ||
| 005 | 20220114114523.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 120626s2012 gw | s |||| 0|eng d | ||
| 020 | |a 9783642301087 |9 978-3-642-30108-7 | ||
| 024 | 7 | |a 10.1007/978-3-642-30108-7 |2 doi | |
| 050 | 4 | |a QC610.9-611.8 | |
| 072 | 7 | |a TJFD5 |2 bicssc | |
| 072 | 7 | |a TEC008090 |2 bisacsh | |
| 072 | 7 | |a TJFD |2 thema | |
| 082 | 0 | 4 | |a 537.622 |2 23 |
| 100 | 1 | |a Bogdanowicz, Janusz. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 245 | 1 | 0 | |a Photomodulated Optical Reflectance |h [electronic resource] : |b A Fundamental Study Aimed at Non-Destructive Carrier Profiling in Silicon / |c by Janusz Bogdanowicz. |
| 250 | |a 1st ed. 2012. | ||
| 264 | 1 | |a Berlin, Heidelberg : |b Springer Berlin Heidelberg : |b Imprint: Springer, |c 2012. | |
| 300 | |a XXIV, 204 p. |b online resource. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 347 | |a text file |b PDF |2 rda | ||
| 490 | 1 | |a Springer Theses, Recognizing Outstanding Ph.D. Research, |x 2190-5061 | |
| 505 | 0 | |a Theory of Perturbation of the Reflectance -- Theory of Perturbation of the Refractive Index -- Theory of Carrier and Heat Transport in Homogeneously Doped Silicon -- Extension of the Transport Theory to Ultra-Shallow Doped Silicon Layers -- Assessment of the Model -- Application of the Model to Carrier Profling. | |
| 520 | |a One of the critical issues in semiconductor technology is the precise electrical characterization of ultra-shallow junctions. Among the plethora of measurement techniques, the optical reflectance approach developed in this work is the sole concept that does not require physical contact, making it suitable for non-invasive in-line metrology. This work develops extensively all the fundamental physical models of the photomodulated optical reflectance technique and introduces novel approaches that extend its applicability from dose monitoring towards detailed carrier profile reconstruction. It represents a significant breakthrough in junction metrology with potential for industrial implementation. | ||
| 650 | 0 | |a Semiconductors. | |
| 650 | 0 | |a Physics. | |
| 650 | 1 | 4 | |a Semiconductors. |
| 650 | 2 | 4 | |a Applied and Technical Physics. |
| 710 | 2 | |a SpringerLink (Online service) | |
| 773 | 0 | |t Springer Nature eBook | |
| 776 | 0 | 8 | |i Printed edition: |z 9783642301094 |
| 776 | 0 | 8 | |i Printed edition: |z 9783642426865 |
| 776 | 0 | 8 | |i Printed edition: |z 9783642301070 |
| 830 | 0 | |a Springer Theses, Recognizing Outstanding Ph.D. Research, |x 2190-5061 | |
| 856 | 4 | 0 | |u https://doi.uam.elogim.com/10.1007/978-3-642-30108-7 |z Texto Completo |
| 912 | |a ZDB-2-PHA | ||
| 912 | |a ZDB-2-SXP | ||
| 950 | |a Physics and Astronomy (SpringerNature-11651) | ||
| 950 | |a Physics and Astronomy (R0) (SpringerNature-43715) | ||