Transmission Electron Microscopy and Diffractometry of Materials

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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A ne...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Fultz, Brent (Autor), Howe, James (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
Edición:4th ed. 2013.
Colección:Graduate Texts in Physics,
Temas:
Spectrum analysis.
Materials-Analysis.
Surfaces (Technology).
Thin films.
Surfaces (Physics).
Spectroscopy.
Characterization and Analytical Technique.
Surfaces, Interfaces and Thin Film.
Surface and Interface and Thin Film.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Diffraction and X-Ray Powder Diffractometer Problems
  • TEM and its Optics Problems
  • Neutron Scattering Problems
  • Scattering Problems
  • Inelastic Electron Scattering and Spectroscopy Problems
  • Diffraction from Crystals Sphere Problems
  • Electron Diffraction and Crystallography Problems
  • Diffraction Contrast in TEM Images Problems
  • Diffraction Lineshapes Problems
  • Patterson Functions and Diffuse Scattering Problems
  • High-Resolution TEM Imaging Problems
  • High-Resolution STEM and Related Imaging Techniques Problems
  • Dynamical Theory Problems.

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