Transmission Electron Microscopy and Diffractometry of Materials

Mostrar otras versiones (1)

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A ne...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Fultz, Brent (Autor), Howe, James (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
Edición:4th ed. 2013.
Colección:Graduate Texts in Physics,
Temas:
Spectrum analysis.
Materials-Analysis.
Surfaces (Technology).
Thin films.
Surfaces (Physics).
Spectroscopy.
Characterization and Analytical Technique.
Surfaces, Interfaces and Thin Film.
Surface and Interface and Thin Film.
Acceso en línea:Texto Completo

Ejemplares similares

Ejemplares similares