Acoustic Scanning Probe Microscopy

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Marinello, Francesco (Editor ), Passeri, Daniele (Editor ), Savio, Enrico (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
Edición:1st ed. 2013.
Colección:NanoScience and Technology,
Temas:
Lasers.
Microtechnology.
Microelectromechanical systems.
Acoustics.
Nanotechnology.
Materials-Analysis.
Surfaces (Technology).
Thin films.
Laser.
Microsystems and MEMS.
Characterization and Analytical Technique.
Surfaces, Interfaces and Thin Film.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • From the contents: Overview of acoustic techniques
  • Contact dynamics modelling
  • Cantilever dynamics: theoretical modeling
  • Finite elements modelling
  • AFAM calibration
  • Enhanced sensitivity
  • UAFM
  • Holography calibration
  • UFM
  • Friction/lateral techniques
  • Harmonix
  • Scanning microdeformation microscopy (SMM)
  • Tip wear
  • Comparison with other techniques
  • Applications polymer
  • Thin films.

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