Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces /

In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructur...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Sadewasser, Sascha (Editor ), Glatzel, Thilo (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2012.
Edición:1st ed. 2012.
Colección:Springer Series in Surface Sciences, 48
Temas:
Surfaces (Technology).
Thin films.
Thermodynamics.
Heat engineering.
Heat transfer.
Mass transfer.
Surfaces, Interfaces and Thin Film.
Engineering Thermodynamics, Heat and Mass Transfer.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Introduction
  • I. Technical Aspects
  • Experimental technique and working modes
  • Phase Modulation Kelvin Probe Microscopy
  • Data interpretation, spatial resolution and deconvolution
  • Contribution of the numerical approach to Kelvin probe force microscopies
  • Quantum mechanical simulations of electrostatic tip-sample interactions
  • II. Selected Applications
  • Surface properties of III-V semiconductors
  • Electronic surface properties of semiconductors devices
  • Optoelectronic studies of solar cells
  • Electrical characterization of low dimensional systems (quantum/nano-structures)
  • Electronic structure of molecular assemblies
  • KPFM for biochemical analysis
  • Local work function analysis of photo catalysts
  • Kelvin probe force microscopy with atomic resolution
  • Summary.

Ejemplares similares