Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces /

In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructur...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Sadewasser, Sascha (Editor ), Glatzel, Thilo (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2012.
Edición:1st ed. 2012.
Colección:Springer Series in Surface Sciences, 48
Temas:
Surfaces (Technology).
Thin films.
Thermodynamics.
Heat engineering.
Heat transfer.
Mass transfer.
Surfaces, Interfaces and Thin Film.
Engineering Thermodynamics, Heat and Mass Transfer.
Acceso en línea:Texto Completo
Descripción
Sumario:In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
Descripción Física:XIV, 334 p. online resource.
ISBN:9783642225666
ISSN:2198-4743 ;

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