Low Power and Reliable SRAM Memory Cell and Array Design
Success in the development of recent advanced semiconductor device technologies is due to the success of SRAM memory cells. This book addresses various issues for designing SRAM memory cells for advanced CMOS technology. To study LSI design, SRAM cell design is the best materials subject because iss...
Clasificación: | Libro Electrónico |
---|---|
Autor Corporativo: | SpringerLink (Online service) |
Otros Autores: | Ishibashi, Koichiro (Editor ), Osada, Kenichi (Editor ) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2011.
|
Edición: | 1st ed. 2011. |
Colección: | Springer Series in Advanced Microelectronics,
31 |
Temas: | |
Acceso en línea: | Texto Completo |
Ejemplares similares
-
Low-Frequency Noise in Advanced MOS Devices
por: Haartman, Martin, et al.
Publicado: (2007) -
Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration /
por: Zjajo, Amir, et al.
Publicado: (2011) -
MEMS Reliability
por: Hartzell, Allyson L., et al.
Publicado: (2011) -
Microcontrollers in Practice
por: Susnea, Ioan, et al.
Publicado: (2005) -
Electrical Power Systems and Computers Selected Papers from the 2011 International Conference on Electric and Electronics (EEIC 2011) in Nanchang, China on June 20-22, 2011, Volume 3 /
Publicado: (2011)