X-Ray Diffraction Crystallography Introduction, Examples and Solved Problems /

X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Waseda, Yoshio (Autor), Matsubara, Eiichiro (Autor), Shinoda, Kozo (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2011.
Edición:1st ed. 2011.
Temas:
Materials-Analysis.
Crystallography.
Microtechnology.
Microelectromechanical systems.
Condensed matter.
Spectrum analysis.
Characterization and Analytical Technique.
Crystallography and Scattering Methods.
Microsystems and MEMS.
Condensed Matter Physics.
Spectroscopy.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Fundamental Properties of X-rays
  • Geometry of Crystals
  • Scattering and Diffraction by Atoms and Crystals
  • Diffraction from a Polycrystalline Sample and its Application to Determination of Crystal Structures
  • Reciprocal Lattice and Integrated Intensity from Crystals
  • Symmetry Analysis for Crystals and the Use of International Tables
  • Solved Problems.

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