New Horizons of Applied Scanning Electron Microscopy

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realize...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Shimizu, Kenichi (Autor), Mitani, Tomoaki (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2010.
Edición:1st ed. 2010.
Colección:Springer Series in Surface Sciences, 45
Temas:
Surfaces (Technology).
Thin films.
Measurement.
Measuring instruments.
Condensed matter.
Spectrum analysis.
Nanotechnology.
Microtechnology.
Microelectromechanical systems.
Surfaces, Interfaces and Thin Film.
Measurement Science and Instrumentation.
Condensed Matter Physics.
Spectroscopy.
Microsystems and MEMS.
Acceso en línea:Texto Completo
Descripción
Sumario:In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.
Descripción Física:XIV, 182 p. 102 illus., 25 illus. in color. online resource.
ISBN:9783642031601
ISSN:2198-4743 ;

Ejemplares similares