Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials /

This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to el...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Breitenstein, Otwin (Autor), Warta, Wilhelm (Autor), Langenkamp, Martin (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2010.
Edición:2nd ed. 2010.
Colección:Springer Series in Advanced Microelectronics, 10
Temas:
Lasers.
Materials-Analysis.
Engineering.
Building materials.
Laser.
Characterization and Analytical Technique.
Technology and Engineering.
Structural Materials.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Introduction
  • Physical and Technical Basics
  • Timing Strategies
  • Heat Dissipation Mechanisms in Solar Cells
  • Carrier Density Imaging
  • Illuminated Lock-in Thermography (ILIT)
  • Experimental Technique
  • Theory
  • Measurement Strategies
  • Typical Applications
  • Summary and Outlook.

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