Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials /
This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to el...
Clasificación: | Libro Electrónico |
---|---|
Autores principales: | Breitenstein, Otwin (Autor), Warta, Wilhelm (Autor), Langenkamp, Martin (Autor) |
Autor Corporativo: | SpringerLink (Online service) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2010.
|
Edición: | 2nd ed. 2010. |
Colección: | Springer Series in Advanced Microelectronics,
10 |
Temas: | |
Acceso en línea: | Texto Completo |
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