Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials /

This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to el...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Breitenstein, Otwin (Autor), Warta, Wilhelm (Autor), Langenkamp, Martin (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2010.
Edición:2nd ed. 2010.
Colección:Springer Series in Advanced Microelectronics, 10
Temas:
Lasers.
Materials-Analysis.
Engineering.
Building materials.
Laser.
Characterization and Analytical Technique.
Technology and Engineering.
Structural Materials.
Acceso en línea:Texto Completo

MARC

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245 1 0 |a Lock-in Thermography  |h [electronic resource] :  |b Basics and Use for Evaluating Electronic Devices and Materials /  |c by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp. 
250 |a 2nd ed. 2010. 
264 1 |a Berlin, Heidelberg :  |b Springer Berlin Heidelberg :  |b Imprint: Springer,  |c 2010. 
300 |a X, 258 p. 89 illus., 33 illus. in color.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
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490 1 |a Springer Series in Advanced Microelectronics,  |x 2197-6643 ;  |v 10 
505 0 |a Introduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook. 
520 |a This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced. 
650 0 |a Lasers. 
650 0 |a Materials-Analysis. 
650 0 |a Engineering. 
650 0 |a Building materials. 
650 1 4 |a Laser. 
650 2 4 |a Characterization and Analytical Technique. 
650 2 4 |a Technology and Engineering. 
650 2 4 |a Structural Materials. 
700 1 |a Warta, Wilhelm.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
700 1 |a Langenkamp, Martin.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer Nature eBook 
776 0 8 |i Printed edition:  |z 9783642264788 
776 0 8 |i Printed edition:  |z 9783642024184 
776 0 8 |i Printed edition:  |z 9783642024160 
830 0 |a Springer Series in Advanced Microelectronics,  |x 2197-6643 ;  |v 10 
856 4 0 |u https://doi.uam.elogim.com/10.1007/978-3-642-02417-7  |z Texto Completo 
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912 |a ZDB-2-SXE 
950 |a Engineering (SpringerNature-11647) 
950 |a Engineering (R0) (SpringerNature-43712) 

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