Hardware and Software: Verification and Testing 4th International Haifa Verification Conference, HVC 2008, Haifa, Israel, October 27-30, 2008, Revised Selected Papers /

This book constitutes the thoroughly refereed post-conference proceedings of the 4th International Haifa Verification Conference, HVC 2008, held in Haifa, Israel in October 2008. The 12 revised full papers and 4 tool papers presented together with 6 invited lectures were carefully reviewed and selec...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Chockler, Hana (Editor ), Hu, Alan J. (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2009.
Edición:1st ed. 2009.
Colección:Programming and Software Engineering, 5394
Temas:
Software engineering.
Computer science.
Compilers (Computer programs).
Software Engineering.
Computer Science Logic and Foundations of Programming.
Compilers and Interpreters.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Section 1: Invited Talks
  • Hazards of Verification
  • Automata-Theoretic Model Checking Revisited
  • Proofs, Interpolants, and Relevance Heuristics
  • Is Verification Getting Too Complex?
  • Can Mutation Analysis Help Fix Our Broken Coverage Metrics?
  • Practical Considerations Concerning HL-to -RT Equivalence Checking
  • Section 2: Regular Papers
  • A Framework for Inherent Vacuity
  • A Meta Heuristic for Effectively Detecting Concurrency Errors
  • A Uniform Approach to Three-Valued Semantics for ?-Calculus on Abstractions of Hybrid Automata
  • Automatic Boosting of Cross-Product Coverage Using Bayesian Networks
  • Efficient Decision Procedure for Bounded Integer Non-linear Operations Using SMT( )
  • Evaluating Workloads Using Comparative Functional Coverage
  • Iterative Delta Debugging
  • Linear-Time Reductions of Resolution Proofs
  • Significant Diagnostic Counterexamples in Probabilistic Model Checking
  • Statistical Model Checking of Mixed-Analog Circuits with an Application to a Third Order ????? Modulator
  • Structural Contradictions
  • Synthesizing Test Models from Test Cases
  • Section 3: Tool Papers
  • d-TSR: Parallelizing SMT-Based BMC Using Tunnels over a Distributed Framework
  • Progress in Automated Software Defect Prediction
  • SeeCode - A Code Review Plug-in for Eclipse
  • User-Friendly Model Checking: Automatically Configuring Algorithms with RuleBase/PE.

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