Image Processing of Edge and Surface Defects Theoretical Basis of Adaptive Algorithms with Numerous Practical Applications /
The edge and surface inspection is one of the most important and most challenging tasks in quality assessment in industrial production. Typical defects are cracks, inclusions, pores, surface flakings, partial or complete tears of material surface and s.o. These defects can occur through defective so...
Clasificación: | Libro Electrónico |
---|---|
Autor principal: | Louban, Roman (Autor) |
Autor Corporativo: | SpringerLink (Online service) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2009.
|
Edición: | 1st ed. 2009. |
Colección: | Springer Series in Materials Science,
123 |
Temas: | |
Acceso en línea: | Texto Completo |
Ejemplares similares
-
Oxide and Nitride Semiconductors Processing, Properties, and Applications /
Publicado: (2009) -
Dilute III-V Nitride Semiconductors and Material Systems Physics and Technology /
Publicado: (2008) -
Springer Handbook of Lasers and Optics
Publicado: (2007) -
Organic Nanostructures for Next Generation Devices
Publicado: (2008) -
Semiconductor Optics
por: Klingshirn, Claus F.
Publicado: (2005)