EMC 2008 Vol 1: Instrumentation and Methods /

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Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Luysberg, Martina (Editor ), Tillmann, Karsten (Editor ), Weirich, Thomas (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008.
Edición:1st ed. 2008.
Temas:
Physics.
Astronomy.
Physics and Astronomy.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Instrumentation and Methods
  • TEM and STEM instrumentation and Electron Optics
  • TEM and STEM methods
  • SEM/FIB Instrumentation and Methods
  • Other Microscopies
  • Image analysis and Processing
  • Sample Preparation for Materials Science and Biology.

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