Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Bhushan, Bharat (Editor ), Fuchs, Harald (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2009.
Edición:1st ed. 2009.
Colección:NanoScience and Technology,
Temas:
Microtechnology.
Microelectromechanical systems.
Spectrum analysis.
Surfaces (Physics).
Nanotechnology.
Surfaces (Technology).
Thin films.
Polymers.
Microsystems and MEMS.
Spectroscopy.
Surface and Interface and Thin Film.
Surfaces, Interfaces and Thin Film.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Oscillation Control in Dynamic SPM with Quartz Sensors
  • Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation
  • Mechanical Diode-Based Ultrasonic Atomic Force Microscopies
  • Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science
  • Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements
  • AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip
  • Local Mechanical Properties by Atomic Force Microscopy Nanoindentations
  • Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.

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