Transmission Electron Microscopy and Diffractometry of Materials

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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of th...

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Détails bibliographiques
Cote:Libro Electrónico
Auteurs principaux: Fultz, Brent (Auteur), Howe, James (Auteur)
Collectivité auteur: SpringerLink (Online service)
Format: Électronique eBook
Langue:Inglés
Publié: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008.
Édition:3rd ed. 2008.
Sujets:
Materials-Analysis.
Surfaces (Technology).
Thin films.
Crystallography.
Condensed matter.
Spectrum analysis.
Engineering.
Characterization and Analytical Technique.
Surfaces, Interfaces and Thin Film.
Crystallography and Scattering Methods.
Condensed Matter Physics.
Spectroscopy.
Technology and Engineering.
Accès en ligne:Texto Completo
Table des matières:
  • Diffraction and the X-Ray Powder Diffractometer
  • The TEM and its Optics
  • Scattering
  • Inelastic Electron Scattering and Spectroscopy
  • Diffraction from Crystals
  • Electron Diffraction and Crystallography
  • Diffraction Contrast in TEM Images
  • Diffraction Lineshapes
  • Patterson Functions and Diffuse Scattering
  • High-Resolution TEM Imaging
  • High-Resolution STEM Imaging
  • Dynamical Theory.

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