Transmission Electron Microscopy and Diffractometry of Materials

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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of th...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Fultz, Brent (Autor), Howe, James (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008.
Edición:3rd ed. 2008.
Temas:
Materials-Analysis.
Surfaces (Technology).
Thin films.
Crystallography.
Condensed matter.
Spectrum analysis.
Engineering.
Characterization and Analytical Technique.
Surfaces, Interfaces and Thin Film.
Crystallography and Scattering Methods.
Condensed Matter Physics.
Spectroscopy.
Technology and Engineering.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Diffraction and the X-Ray Powder Diffractometer
  • The TEM and its Optics
  • Scattering
  • Inelastic Electron Scattering and Spectroscopy
  • Diffraction from Crystals
  • Electron Diffraction and Crystallography
  • Diffraction Contrast in TEM Images
  • Diffraction Lineshapes
  • Patterson Functions and Diffuse Scattering
  • High-Resolution TEM Imaging
  • High-Resolution STEM Imaging
  • Dynamical Theory.

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