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Applied Scanning Probe Methods VI Characterization /

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspect...

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Detalles Bibliográficos
Clasificación:	Libro Electrónico
Autor Corporativo:	SpringerLink (Online service)
Otros Autores:	Bhushan, Bharat (Editor ), Kawata, Satoshi (Editor )
Formato:	Electrónico eBook
Idioma:	Inglés
Publicado:	Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2007.
Edición:	1st ed. 2007.
Colección:	NanoScience and Technology,
Temas:	Microtechnology. Microelectromechanical systems. Nanotechnology. Surfaces (Technology). Thin films. Polymers. Physical chemistry. Condensed matter. Microsystems and MEMS. Surfaces, Interfaces and Thin Film. Physical Chemistry. Condensed Matter Physics.
Acceso en línea:	Texto Completo

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