Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques /

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspect...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Bhushan, Bharat (Editor ), Fuchs, Harald (Editor ), Kawata, Satoshi (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2007.
Edición:1st ed. 2007.
Colección:NanoScience and Technology,
Temas:
Microtechnology.
Microelectromechanical systems.
Spectrum analysis.
Surfaces (Physics).
Nanotechnology.
Surfaces (Technology).
Thin films.
Polymers.
Microsystems and MEMS.
Spectroscopy.
Surface and Interface and Thin Film.
Surfaces, Interfaces and Thin Film.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Integrated Cantilevers and Atomic Force Microscopes
  • Electrostatic Microscanner
  • Low-Noise Methods for Optical Measurements of Cantilever Deflections
  • Q-controlled Dynamic Force Microscopy in Air and Liquids
  • High-Frequency Dynamic Force Microscopy
  • Torsional Resonance Microscopy and Its Applications
  • Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy
  • Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale
  • New AFM Developments to Study Elasticity and Adhesion at the Nanoscale
  • Near-Field Raman Spectroscopy and Imaging.

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