Gettering Defects in Semiconductors
Gettering Defects in Semiconductors fulfills three basic purposes: - to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics; - to identify new directions in research, particularly to enhance the perspective of professionals and y...
Clasificación: | Libro Electrónico |
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Autores principales: | Perevostchikov, Victor A. (Autor), Skoupov, Vladimir D. (Autor) |
Autor Corporativo: | SpringerLink (Online service) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2005.
|
Edición: | 1st ed. 2005. |
Colección: | Springer Series in Advanced Microelectronics,
19 |
Temas: | |
Acceso en línea: | Texto Completo |
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