Fringe 2005 The 5th International Workshop on Automatic Processing of Finge Patterns /

The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moiré and Grid Techniques for S...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Osten, Wolfgang (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2006.
Edición:1st ed. 2006.
Temas:
Security systems.
Manufactures.
Lasers.
Control engineering.
Robotics.
Automation.
Security Science and Technology.
Machines, Tools, Processes.
Laser.
Control, Robotics, Automation.
Acceso en línea:Texto Completo

MARC

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245 1 0 |a Fringe 2005  |h [electronic resource] :  |b The 5th International Workshop on Automatic Processing of Finge Patterns /  |c edited by Wolfgang Osten. 
250 |a 1st ed. 2006. 
264 1 |a Berlin, Heidelberg :  |b Springer Berlin Heidelberg :  |b Imprint: Springer,  |c 2006. 
300 |a XVIII, 714 p.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
505 0 |a Key Note -- New Methods and Tools for Data Processing -- Resolution Enhanced Technologies -- Wide Scale 4D Optical Metrology -- Hybrid Measurement Technologies -- New Optical Sensors and Measurement Systems. 
520 |a The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moiré and Grid Techniques for Stress Analysis, Nondestructive Testing, Shape Measurement, Fault Detection, Quality Control and related fields. Topics of particular interest are: Advanced Computer Aided Measurement Techniques; Resolution Enhanced Technologies in Optical Metrology; New approaches in Wide Scale 4D Optical Metrology; Sophisticated Sensors Systems and their applications for the solution of challenging measurement problems. Special emphasis is put on modern Measurement Strategies taking into account the active combination of Physical Modeling, Computer Aided Simulation and Experimental Data Acquisition. Further attention is directed to new approaches for the Extension of Existing Resolution Limits that open the gates to Wide Scale Metrology ranging from nano to macro by using Advanced Optical Sensor Systems. . 
650 0 |a Security systems. 
650 0 |a Manufactures. 
650 0 |a Lasers. 
650 0 |a Control engineering. 
650 0 |a Robotics. 
650 0 |a Automation. 
650 1 4 |a Security Science and Technology. 
650 2 4 |a Machines, Tools, Processes. 
650 2 4 |a Laser. 
650 2 4 |a Control, Robotics, Automation. 
700 1 |a Osten, Wolfgang.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer Nature eBook 
776 0 8 |i Printed edition:  |z 9783642065330 
776 0 8 |i Printed edition:  |z 9783540811022 
776 0 8 |i Printed edition:  |z 9783540260370 
856 4 0 |u https://doi.uam.elogim.com/10.1007/3-540-29303-5  |z Texto Completo 
912 |a ZDB-2-ENG 
912 |a ZDB-2-SXE 
950 |a Engineering (SpringerNature-11647) 
950 |a Engineering (R0) (SpringerNature-43712) 

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