Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces /

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a l...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Kaupp, Gerd (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2006.
Edición:1st ed. 2006.
Colección:NanoScience and Technology,
Temas:
Microtechnology.
Microelectromechanical systems.
Social sciences.
Humanities.
Physical chemistry.
Nanotechnology.
Lasers.
Engineering.
Microsystems and MEMS.
Humanities and Social Sciences.
Physical Chemistry.
Laser.
Technology and Engineering.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Atomic Force Microscopy
  • Scanning Near-Field Optical Microscopy
  • Nanoindentation
  • Nanoscratching.

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