Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques /

The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope,...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Bhushan, Bharat (Editor ), Fuchs, Harald (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2006.
Edición:1st ed. 2006.
Colección:NanoScience and Technology,
Temas:
Microtechnology.
Microelectromechanical systems.
Spectrum analysis.
Surfaces (Physics).
Nanotechnology.
Surfaces (Technology).
Thin films.
Polymers.
Microsystems and MEMS.
Spectroscopy.
Surface and Interface and Thin Film.
Surfaces, Interfaces and Thin Film.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Higher Harmonics in Dynamic Atomic Force Microscopy
  • Atomic Force Acoustic Microscopy
  • Scanning Ion Conductance Microscopy
  • Spin-Polarized Scanning Tunneling Microscopy
  • Dynamic Force Microscopy and Spectroscopy
  • Sensor Technology for Scanning Probe Microscopy and New Applications
  • Quantitative Nanomechanical Measurements in Biology
  • Scanning Microdeformation Microscopy: Subsurface Imaging and Measurement of Elastic Constants at Mesoscopic Scale
  • Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interest and Application to Characterisation of Semiconductor Materials and Devices
  • Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures
  • Focused Ion Beam as a Scanning Probe: Methods and Applications.

Ejemplares similares