Applied Scanning Probe Methods IV Industrial Applications /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Bhushan, Bharat (Editor ), Fuchs, Harald (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2006.
Edición:1st ed. 2006.
Colección:NanoScience and Technology,
Temas:
Microtechnology.
Microelectromechanical systems.
Spectrum analysis.
Surfaces (Physics).
Nanotechnology.
Surfaces (Technology).
Thin films.
Polymers.
Microsystems and MEMS.
Spectroscopy.
Surface and Interface and Thin Film.
Surfaces, Interfaces and Thin Film.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Scanning Probe Lithography for Chemical, Biological and Engineering Applications
  • Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM)
  • Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography
  • Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography
  • Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM)
  • Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection
  • Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices
  • Applications of Heated Atomic Force Microscope Cantilevers.

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