Applied Scanning Probe Methods III Characterization /

The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scop...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Bhushan, Bharat (Editor ), Fuchs, Harald (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2006.
Edición:1st ed. 2006.
Colección:NanoScience and Technology,
Temas:
Microtechnology.
Microelectromechanical systems.
Spectrum analysis.
Surfaces (Physics).
Nanotechnology.
Surfaces (Technology).
Thin films.
Polymers.
Microsystems and MEMS.
Spectroscopy.
Surface and Interface and Thin Film.
Surfaces, Interfaces and Thin Film.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Atomic Force Microscopy in Nanomedicine
  • Scanning Probe Microscopy: From Living Cells to the Subatomic Range
  • Surface Characterization and Adhesion and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Superhydrophobic Surfaces
  • Probing Macromolecular Dynamics and the Influence of Finite Size Effects
  • Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum
  • One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures
  • Scanning Probe Microscopy Applied to Ferroelectric Materials
  • Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy
  • AFM Applications for Contact and Wear Simulation
  • AFM Applications for Analysis of Fullerene-Like Nanoparticles
  • Scanning Probe Methods in the Magnetic Tape Industry.

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