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VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers /
This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from t...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor Corporativo: | |
| Otros Autores: | , , , , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Cham :
Springer International Publishing : Imprint: Springer,
2016.
|
| Edición: | 1st ed. 2016. |
| Colección: | IFIP Advances in Information and Communication Technology,
483 |
| Temas: | |
| Acceso en línea: | Texto Completo |
MARC
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| 245 | 1 | 0 | |a VLSI-SoC: Design for Reliability, Security, and Low Power |h [electronic resource] : |b 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers / |c edited by Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis. |
| 250 | |a 1st ed. 2016. | ||
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| 300 | |a XIII, 223 p. 121 illus. |b online resource. | ||
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| 490 | 1 | |a IFIP Advances in Information and Communication Technology, |x 1868-422X ; |v 483 | |
| 520 | |a This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems. | ||
| 650 | 0 | |a Computer engineering. | |
| 650 | 0 | |a Computer networks . | |
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| 650 | 0 | |a Computer-aided engineering. | |
| 650 | 0 | |a Electronic circuits. | |
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| 700 | 1 | |a Tsui, Chi Ying. |e editor. |4 edt |4 http://id.loc.gov/vocabulary/relators/edt | |
| 700 | 1 | |a Kim, Jae-Joon. |e editor. |4 edt |4 http://id.loc.gov/vocabulary/relators/edt | |
| 700 | 1 | |a Choi, Kiyoung. |e editor. |4 edt |4 http://id.loc.gov/vocabulary/relators/edt | |
| 700 | 1 | |a Reis, Ricardo. |e editor. |0 (orcid)0000-0001-5781-5858 |1 https://orcid.org/0000-0001-5781-5858 |4 edt |4 http://id.loc.gov/vocabulary/relators/edt | |
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| 830 | 0 | |a IFIP Advances in Information and Communication Technology, |x 1868-422X ; |v 483 | |
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