VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers /

This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from t...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Shin, Youngsoo (Editor ), Tsui, Chi Ying (Editor ), Kim, Jae-Joon (Editor ), Choi, Kiyoung (Editor ), Reis, Ricardo (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Cham : Springer International Publishing : Imprint: Springer, 2016.
Edición:1st ed. 2016.
Colección:IFIP Advances in Information and Communication Technology, 483
Temas:
Computer engineering.
Computer networks .
Computers.
Computer-aided engineering.
Electronic circuits.
Computer Engineering and Networks.
Computer Hardware.
Computer-Aided Engineering (CAD, CAE) and Design.
Electronic Circuits and Systems.
Acceso en línea:Texto Completo
Descripción
Sumario:This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.
Descripción Física:XIII, 223 p. 121 illus. online resource.
ISBN:9783319460970
ISSN:1868-422X ;

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