Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM /

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This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a ne...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Egerton, R.F (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Cham : Springer International Publishing : Imprint: Springer, 2016.
Edición:2nd ed. 2016.
Temas:
Materials-Analysis.
Spectrum analysis.
Biophysics.
Nanotechnology.
Characterization and Analytical Technique.
Spectroscopy.
Bioanalysis and Bioimaging.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • An Introduction to Microscopy
  • Electron Optics
  • The Transmission Electron Microscope
  • TEM Specimens and Images
  • The Scanning Electron Microscope
  • Analytical Electron Microscopy
  • Special Topics
  • Appendix: Mathematical Derivations.

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