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Metrology and Physical Mechanisms in New Generation Ionic Devices
The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author ach...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Cham :
Springer International Publishing : Imprint: Springer,
2016.
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| Edición: | 1st ed. 2016. |
| Colección: | Springer Theses, Recognizing Outstanding Ph.D. Research,
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| Temas: | |
| Acceso en línea: | Texto Completo |
Tabla de Contenidos:
- Introduction
- Filamentary-Based Resistive Switching
- Nanoscaled Electrical Characterization
- Conductive Filaments: Formation, Observation and Manipulation
- Three-Dimensional Filament Observation
- Reliability Threats in CBRAM
- Conclusions and Outlook. .