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Metrology and Physical Mechanisms in New Generation Ionic Devices
The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author ach...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Cham :
Springer International Publishing : Imprint: Springer,
2016.
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| Edición: | 1st ed. 2016. |
| Colección: | Springer Theses, Recognizing Outstanding Ph.D. Research,
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| Temas: | |
| Acceso en línea: | Texto Completo |
MARC
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| 001 | 978-3-319-39531-9 | ||
| 003 | DE-He213 | ||
| 005 | 20220116101111.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 160618s2016 sz | s |||| 0|eng d | ||
| 020 | |a 9783319395319 |9 978-3-319-39531-9 | ||
| 024 | 7 | |a 10.1007/978-3-319-39531-9 |2 doi | |
| 050 | 4 | |a QD95-96 | |
| 072 | 7 | |a PNFS |2 bicssc | |
| 072 | 7 | |a SCI078000 |2 bisacsh | |
| 072 | 7 | |a PNFS |2 thema | |
| 082 | 0 | 4 | |a 543 |2 23 |
| 100 | 1 | |a Celano, Umberto. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 245 | 1 | 0 | |a Metrology and Physical Mechanisms in New Generation Ionic Devices |h [electronic resource] / |c by Umberto Celano. |
| 250 | |a 1st ed. 2016. | ||
| 264 | 1 | |a Cham : |b Springer International Publishing : |b Imprint: Springer, |c 2016. | |
| 300 | |a XXIV, 175 p. 96 illus., 18 illus. in color. |b online resource. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 347 | |a text file |b PDF |2 rda | ||
| 490 | 1 | |a Springer Theses, Recognizing Outstanding Ph.D. Research, |x 2190-5061 | |
| 505 | 0 | |a Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook. . | |
| 520 | |a The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. . | ||
| 650 | 0 | |a Spectrum analysis. | |
| 650 | 0 | |a Microtechnology. | |
| 650 | 0 | |a Microelectromechanical systems. | |
| 650 | 0 | |a Materials-Analysis. | |
| 650 | 1 | 4 | |a Spectroscopy. |
| 650 | 2 | 4 | |a Microsystems and MEMS. |
| 650 | 2 | 4 | |a Characterization and Analytical Technique. |
| 710 | 2 | |a SpringerLink (Online service) | |
| 773 | 0 | |t Springer Nature eBook | |
| 776 | 0 | 8 | |i Printed edition: |z 9783319395302 |
| 776 | 0 | 8 | |i Printed edition: |z 9783319395326 |
| 776 | 0 | 8 | |i Printed edition: |z 9783319819068 |
| 830 | 0 | |a Springer Theses, Recognizing Outstanding Ph.D. Research, |x 2190-5061 | |
| 856 | 4 | 0 | |u https://doi.uam.elogim.com/10.1007/978-3-319-39531-9 |z Texto Completo |
| 912 | |a ZDB-2-PHA | ||
| 912 | |a ZDB-2-SXP | ||
| 950 | |a Physics and Astronomy (SpringerNature-11651) | ||
| 950 | |a Physics and Astronomy (R0) (SpringerNature-43715) | ||