Soft Error Mechanisms, Modeling and Mitigation

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Sayil, Selahattin (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Cham : Springer International Publishing : Imprint: Springer, 2016.
Edición:1st ed. 2016.
Temas:
Electronic circuits.
Microprocessors.
Computer architecture.
Electronic Circuits and Systems.
Processor Architectures.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Introduction
  • Mitigation of Single Event Effects
  • Transmission Gate (TG) Based Soft Error Mitigation Methods
  • Single Event Soft Error Mechanisms
  • Modeling Single Event Crosstalk Noise in Nanometer Technologies
  • Modeling of Single Event Coupling Delay and Speedup Effects
  • Single Event Upset Hardening of Interconnects
  • Soft-Error Aware Power Optimization
  • Dynamic Threshold Technique for Soft Error and Soft Delay Mitigation.

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