Transmission Electron Microscopy Diffraction, Imaging, and Spectrometry /

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Carter, C. Barry (Editor ), Williams, David B. (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Cham : Springer International Publishing : Imprint: Springer, 2016.
Edición:1st ed. 2016.
Temas:
Materials-Analysis.
Nanoscience.
Spectrum analysis.
Condensed matter.
Mechanics, Applied.
Solids.
Characterization and Analytical Technique.
Nanophysics.
Spectroscopy.
Condensed Matter Physics.
Solid Mechanics.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Foreword by Sir John Meurig Thomas
  • 1. Electron Sources
  • 2. In Situ and Operando
  • 3. Electron Diffraction and Phase Identification
  • 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns
  • 5. Electron crystallography, charge-density mapping and nanodiffraction
  • 6. Digital Micrograph
  • 7. Electron waves, interference & coherence
  • 8. Electron Holography
  • 9. Focal-Series Reconstruction
  • 10. Direct Methods For Image Interpretation
  • 11. Imaging in the STEM
  • 12. Electron Tomography
  • 13. Energy-Filtered Transmission Electron Microscopy
  • 14. Calculation of Electron Energy-Loss Spectra
  • 15. Electron Diffraction & X-Ray Excitation
  • 16. X-Ray and Electron Energy-Loss Spectral Imaging
  • 17. Practical Aspects and Advanced Applications of XEDS.

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