Noncontact Atomic Force Microscopy Volume 3 /

This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applica...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Morita, Seizo (Editor ), Giessibl, Franz J. (Editor ), Meyer, Ernst (Editor ), Wiesendanger, Roland (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Cham : Springer International Publishing : Imprint: Springer, 2015.
Edición:1st ed. 2015.
Colección:NanoScience and Technology,
Temas:
Nanoscience.
Surfaces (Technology).
Thin films.
Spectrum analysis.
Nanotechnology.
Nanophysics.
Surfaces, Interfaces and Thin Film.
Spectroscopy.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • From the Contents: Introduction
  • 3D Force-Field Spectroscopy
  • Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts
  • Spectroscopy and Manipulation Using AFM/STM at Room Temperature
  • The Phantom Force - The Influence of a Tunnel Current on Force Microscopy
  • Non-Contact Friction
  • Magnetic Exchange Force Spectroscopy.

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