Debug Automation from Pre-Silicon to Post-Silicon

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated d...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Dehbashi, Mehdi (Autor), Fey, Görschwin (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Cham : Springer International Publishing : Imprint: Springer, 2015.
Edición:1st ed. 2015.
Temas:
Electronic circuits.
Microprocessors.
Computer architecture.
Electronic Circuits and Systems.
Processor Architectures.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Introduction
  • Preliminaries
  • Part I Debug of Design Bugs
  • Automated Debugging for Logic Bugs
  • Automated Debugging from Pre-Silicon to Post-Silicon
  • Automated Debugging for Synchronization Bugs
  • Part II Debug of Delay Faults
  • Analyzing Timing Variations
  • Automated Debugging for Timing Variations
  • Efficient Automated Speedpath Debugging
  • Part III Debug of Transactions
  • Online Debug for NoC-Based Multiprocessor SoCs
  • Summary and Outlook.

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