Cargando…

The Boundary-Scan Handbook

Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practi...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Parker, Kenneth P. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Cham : Springer International Publishing : Imprint: Springer, 2016.
Edición:4th ed. 2016.
Temas:
Acceso en línea:Texto Completo

MARC

LEADER 00000nam a22000005i 4500
001 978-3-319-01174-5
003 DE-He213
005 20220119174651.0
007 cr nn 008mamaa
008 151111s2016 sz | s |||| 0|eng d
020 |a 9783319011745  |9 978-3-319-01174-5 
024 7 |a 10.1007/978-3-319-01174-5  |2 doi 
050 4 |a TK7867-7867.5 
072 7 |a TJFC  |2 bicssc 
072 7 |a TEC008010  |2 bisacsh 
072 7 |a TJFC  |2 thema 
082 0 4 |a 621.3815  |2 23 
100 1 |a Parker, Kenneth P.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
245 1 4 |a The Boundary-Scan Handbook  |h [electronic resource] /  |c by Kenneth P. Parker. 
250 |a 4th ed. 2016. 
264 1 |a Cham :  |b Springer International Publishing :  |b Imprint: Springer,  |c 2016. 
300 |a XXXIV, 552 p.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
505 0 |a Boundary-Scan Basics And Vocabulary.-  Boundary-Scan Description Language (BSDL) -- Boundary-Scan Testing -- Advanced Boundary-Scan Topics -- Design for Boundary-Scan Test -- Analog Measurement Basics -- IEEE 1149.4 Analog Boundary-Scan.-  IEEE 1149.6 Testing Advanced I/O.-  IEEE 1532:In-System Configuration -- IEEE 1149.8.1: Passive Components -- IEEE 1149.1:The 2013 Revision.-  IEEE 1149.6: The 2015 Revision. 
520 |a Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its practical industrial implementation will need this book. Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers;   Explains the new IEEE 1149.8.1 subsidiary standard and applications;   Describes the latest updates on the supplementary IEEE testing standards. In particular, addresses: IEEE Std 1149.1                      Digital Boundary-Scan IEEE Std 1149.4                      Analog Boundary-Scan IEEE Std 1149.6                      Advanced I/O Testing IEEE Std 1149.8.1                    Passive Component Testing IEEE Std 1149.1-2013                 The 2013 Revision of 1149.1 IEEE Std 1532                        In-System Configuration IEEE Std 1149.6-2015                 The 2015 Revision of 1149.6. 
650 0 |a Electronic circuits. 
650 0 |a Microprocessors. 
650 0 |a Computer architecture. 
650 0 |a Semiconductors. 
650 1 4 |a Electronic Circuits and Systems. 
650 2 4 |a Processor Architectures. 
650 2 4 |a Semiconductors. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer Nature eBook 
776 0 8 |i Printed edition:  |z 9783319011738 
776 0 8 |i Printed edition:  |z 9783319011752 
776 0 8 |i Printed edition:  |z 9783319330693 
856 4 0 |u https://doi.uam.elogim.com/10.1007/978-3-319-01174-5  |z Texto Completo 
912 |a ZDB-2-ENG 
912 |a ZDB-2-SXE 
950 |a Engineering (SpringerNature-11647) 
950 |a Engineering (R0) (SpringerNature-43712)