Trace-Based Post-Silicon Validation for VLSI Circuits

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and c...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Liu, Xiao (Autor), Xu, Qiang (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Cham : Springer International Publishing : Imprint: Springer, 2014.
Edición:1st ed. 2014.
Colección:Lecture Notes in Electrical Engineering, 252
Temas:
Electronic circuits.
Microprocessors.
Computer architecture.
Semiconductors.
Electronic Circuits and Systems.
Processor Architectures.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Introduction
  • State of the Art on Post-Silicon Validation
  • Signal Selection for Visibility Enhancement
  • Multiplexed Tracing for Design Error
  • Tracing for Electrical Error
  • Reusing Test Access Mechanisms
  • Interconnection Fabric for Flexible Tracing
  • Interconnection Fabric for Systematic Tracing
  • Conclusion.

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