Integrated Circuit Test Engineering Modern Techniques /

Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test e...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Grout, Ian A. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London : Springer London : Imprint: Springer, 2006.
Edición:1st ed. 2006.
Temas:
Electronic circuits.
Electrical engineering.
Electronics.
Computers.
Electronic digital computers-Evaluation.
Industrial engineering.
Production engineering.
Electronic Circuits and Systems.
Electrical and Electronic Engineering.
Electronics and Microelectronics, Instrumentation.
Computer Hardware.
System Performance and Evaluation.
Industrial and Production Engineering.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • to Integrated Circuit Test Engineering
  • Fabrication Processes for Integrated Circuits
  • Digital Logic Test
  • Memory Test
  • Analogue Test
  • Mixed-Signal Test
  • Input-Output Test
  • Design for Testability - Structured Test Approaches
  • System on a Chip (SoC) Test
  • Test Pattern Generation and Fault Simulation
  • Automatic Test Equipment (ATE) and Production Test
  • Test Economics.

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