Bias Temperature Instability for Devices and Circuits

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability.  Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, ano...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Grasser, Tibor (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2014.
Edición:1st ed. 2014.
Temas:
Electronic circuits.
Semiconductors.
Electronics.
Security systems.
Electronic Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Security Science and Technology.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Introduction
  • Characterization, Experimental Challenges
  • Advanced Characterization
  • Characterization of Nanoscale Devices
  • Statistical Properties/Variability
  • Theoretical Understanding
  • Possible Defects: Experimental
  • Possible Defects: First Principles
  • Modeling
  • Technological Impact
  • Silicon dioxides/SiON
  • High-k oxides
  • Alternative technologies
  • Circuits.

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