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Analog IC Reliability in Nanometer CMOS

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit r...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Maricau, Elie (Autor), Gielen, Georges (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2013.
Edición:1st ed. 2013.
Colección:Analog Circuits and Signal Processing,
Temas:
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Introduction
  • CMOS Reliability Overview
  • Transistor Aging Compact Modeling
  • Background on IC Reliability Simulation
  • Analog IC Reliability Simulation
  • Integrated Circuit Reliability
  • Conclusions.