Circuit Design for Reliability

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ran...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Reis, Ricardo (Editor ), Cao, Yu (Editor ), Wirth, Gilson (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2015.
Edición:1st ed. 2015.
Temas:
Electronic circuits.
Security systems.
Computer-aided engineering.
Electronic Circuits and Systems.
Security Science and Technology.
Computer-Aided Engineering (CAD, CAE) and Design.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Introduction
  • Recent Trends in Bias Temperature Instability
  • Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability
  • Atomistic Simulations on Reliability
  • On-chip characterization of statistical device degradation
  • Circuit Resilience Roadmap
  • Layout Aware Electromigration Analysis of Power/Ground Networks
  • Power-Gating for Leakage Control and Beyond
  • Soft Error Rate and Fault Tolerance Techniques for FPGAs.

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