Atom Probe Microscopy

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and puls...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Gault, Baptiste (Autor), Moody, Michael P. (Autor), Cairney, Julie M. (Autor), Ringer, Simon P. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2012.
Edición:1st ed. 2012.
Colección:Springer Series in Materials Science, 160
Temas:
Materials-Analysis.
Nanoscience.
Nanochemistry.
Spectrum analysis.
Nanotechnology.
Characterization and Analytical Technique.
Nanophysics.
Spectroscopy.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Preface
  • Acknowledgements
  • List of Acronyms and Abbreviations
  • List of Terms
  • List of Non-SI Units and Constant Values
  • PART I Fundamentals
  • 1. Introduction
  • 2. Field Ion Microscopy
  • 3 From Field Desorption Microscopy to Atom Probe Tomography
  • Part II Practical aspects
  • 4. Specimen Preparation
  • 5. Experimental protocols in Field Ion Microscopy
  • 6. Experimental protocols
  • 7. Tomographic reconstruction
  • PART III Applying atom probe techniques for materials science
  • 8. Analysis techniques for atom probe tomography
  • 9. Atom probe microscopy and materials science
  • Appendices.

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