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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects.  The authors have created a field guide to show how to handle var...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: McConaghy, Trent (Autor), Breen, Kristopher (Autor), Dyck, Jeffrey (Autor), Gupta, Amit (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2013.
Edición:1st ed. 2013.
Temas:
Acceso en línea:Texto Completo

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