Modeling Nanoscale Imaging in Electron Microscopy

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Vogt, Thomas (Editor ), Dahmen, Wolfgang (Editor ), Binev, Peter (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2012.
Edición:1st ed. 2012.
Colección:Nanostructure Science and Technology,
Temas:
Materials-Analysis.
Analytical chemistry.
Nanotechnology.
Chemistry, Physical and theoretical.
Measurement.
Measuring instruments.
Characterization and Analytical Technique.
Analytical Chemistry.
Theoretical Chemistry.
Measurement Science and Instrumentation.
Acceso en línea:Texto Completo
Descripción
Sumario:Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Descripción Física:IX, 182 p. online resource.
ISBN:9781461421917
ISSN:2197-7976

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