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Metal-Dielectric Interfaces in Gigascale Electronics Thermal and Electrical Stability /

Metal-dielectric interfaces are ubiquitous in modern electronics. As advanced gigascale electronic devices continue to shrink, the stability of these interfaces is becoming an increasingly important issue that has a profound impact on the operational reliability of these devices. In this book, the a...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: He, Ming (Autor), Lu, Toh-Ming (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2012.
Edición:1st ed. 2012.
Colección:Springer Series in Materials Science, 157
Temas:
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Preface
  • 1. Introduction
  • 2. Metal-Dielectric Diffusion Processes: Fundamentals
  • 3. Experimental Techniques
  • 4. Al-Dielectric Interfaces
  • 5. Cu-Dielectric Interfaces
  • 6. Barrier Metal-Dielectric Interfaces
  • 7. Self-Forming Barriers. 8. Kinetics of Ion Drift
  • 9. Time-Dependent Dielectric Breakdown (TDDB) and Future Directions.