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Transient and Permanent Error Control for Networks-on-Chip

This book addresses reliability and energy efficiency of on-chip networks using a configurable error control coding (ECC) scheme for datalink-layer transient error management. The method can adjust both error detection and correction strengths at runtime by varying the number of redundant wires for...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Yu, Qiaoyan (Autor), Ampadu, Paul (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2012.
Edición:1st ed. 2012.
Temas:
Acceso en línea:Texto Completo

MARC

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300 |a XII, 160 p.  |b online resource. 
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505 0 |a Introduction -- Existing Transient and Permanent Error Management in NoCs -- Adaptive Error Control Coding at Datalink Layer -- Transient and Permanent Link Errors Co-Management -- Dual-Layer Cooperative Error Control for Transient Error -- A Flexible Parallel Simulator for Networks-on-Chip with Error Control -- Conclusions and Future Directions. . 
520 |a This book addresses reliability and energy efficiency of on-chip networks using a configurable error control coding (ECC) scheme for datalink-layer transient error management. The method can adjust both error detection and correction strengths at runtime by varying the number of redundant wires for parity-check bits. Methods are also presented to tackle joint transient and permanent error correction, exploiting the redundant resources already available on-chip. A parallel and flexible network simulator is also introduced, which facilitates examining the impact of various error control methods on network-on-chip performance. Includes a complete survey of error control methods for reliable networks-on-chip, evaluated for reliability, energy and performance metrics; Provides analysis of error control in various network-on-chip layers, as well as presentation of an innovative multi-layer error control coding technique; Presents state-of-the-art solutions to address simultaneously reliability, energy and performance; Describes configurable error management solutions and their hardware implementation details for variable noise conditions; Provides details of a flexible and parallel NoC simulator and corresponding simulation setup to achieve the reported results.    . 
650 0 |a Electronic circuits. 
650 0 |a Electronics. 
650 0 |a Microtechnology. 
650 0 |a Microelectromechanical systems. 
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